FormFactor, Inc.
Held is read from USPTO's recorded assignments; a transfer never recorded there does not appear.
Recorded under 3 name spellings.
28
Ending by 2030
Dec 2026
Next term end
When these terms end
Held patents by the year their term ends
20262027202820292030203120322033203420352036203720382039204020412042204320442045
Fee deadlines
Maintenance fees fall due 3.5, 7.5 and 11.5 years after grant. A missed fee ends a patent at the end of the six month grace period that follows, not on the due date.
- 2 fees due Dec 9 to 25, 2026 · next Dec 9
- 4 fees due Jan 14 to 30, 2027 · next Jan 14
- 1 fee due Feb 18, 2027The maintenance fee for Method and Device for Contacting a Row of Contact Areas with Probe Tips (US 9,110,131) comes due Feb 18, 2027. Unpaid by Aug 18, 2027, it lapses early.
- 1 fee due Mar 12, 2027The maintenance fee for Method and device for optically representing electronic semiconductor components (US 11,754,511) comes due Mar 12, 2027. Unpaid by Sep 13, 2027, it lapses early.
- 1 fee due Apr 29, 2027The maintenance fee for Probe Systems and Methods (US 10,459,006) comes due Apr 29, 2027. Unpaid by Oct 29, 2027, it lapses early.
- 3 fees due May 21 to 24, 2027 · next May 21
- 2 fees due Jul 7 to 16, 2027 · next Jul 7
- 3 fees due Aug 2 to 25, 2027 · next Aug 2
- 3 fees due Sep 3 to 24, 2027 · next Sep 3
Recent changes
- 3 of the patents on this record were granted since Aug 16, 2026
- 7 terms have ended since Aug 16, 2026
Patents held now
Soonest term end first. Each date below is computed on that patent's own page, which shows the rule, the adjustments and the fee history it was derived from.
| Patent | Title | Status | Expires | Confidence |
|---|---|---|---|---|
| US 8,120,373 | Stiffener Assembly for Use with Testing Devices In force · High confidence | In force | High confidence | |
| US 7,538,567 | Probe Card with Balanced Lateral Force In force · High confidence | In force | High confidence | |
| US 9,274,143 | Vertical Probe Array Arranged to Provide Space Transformation In force · High confidence | In force | High confidence | |
| US 7,589,542 | Hybrid Probe for Testing Semiconductor Devices In force · High confidence | In force | High confidence | |
| US 7,759,951 | Semicoductor Testing Device with Elastomer Interposer In force · High confidence | In force | High confidence | |
| US 7,573,283 | Method for Measurement of a Device Under Test In force · High confidence | In force | High confidence | |
| US 7,761,966 | Method for Reparing a Microelectromechanical System In force · High confidence | In force | High confidence | |
| US 7,579,854 | Probe Station and Method for Measurements of Semiconductor Devices Under Defined Atmosphere In force · High confidence | In force | High confidence | |
| US 7,733,108 | Method and Arrangement for Positioning a Probe Card In force · Medium confidence | In force | Medium confidence | |
| US 7,791,361 | Planarizing Probe Card In force · High confidence | In force | High confidence |
Also on record, not counted in the 118: 371 lapsed for an unpaid fee · 200 ended at full term. List them
Sources and methods
Compiled from the USPTO record, grants, published applications and recorded assignments, not yet reviewed by hand.
How this record was built
Computed patent terms end on the dates shown. Related patents and pending applications may cover overlapping subject matter.
Published applications
US patent applications published under this name that have not become patents. An application is published about eighteen months after its earliest filing; one that has not been published is in no public record.
12 pending · 62 abandoned